Switching lattices are two-dimensional arrays composed by four-terminal switches (crossbar arrays). The idea of using regular two-dimensional arrays of switches to implement Boolean functions was proposed by Akers in 1972. Recently, with the advent of a variety of emerging nanoscale technologies, lattices have found a renewed interest. Switching lattices can have a non-negligible defective ratio. In this paper, we analyze the fault tolerance of switching lattices under the stuck-at-fault model (SAFM). We first identify the critical switches with a sensitivity analysis of the lattice. We then propose some techniques to improve the resilience to faults, which are implemented as a post preprocessing step after logic optimization.
Fault Mitigation of Switching Lattices under the Stuck-At-Fault Model / L. Anghel, A. Bernasconi, V. Ciriani, L. Frontini, G. Trucco, I. Vatajelu - In: 2019 IEEE Latin American Test Symposium (LATS)[s.l] : IEEE, 2019. - ISBN 9781728117560. - pp. 1-6 (( convegno Latin American Test Symposium tenutosi a Santiago nel 2019.
Titolo: | Fault Mitigation of Switching Lattices under the Stuck-At-Fault Model |
Autori: | |
Parole Chiave: | Switching lattices; Stuck-At-Fault Model; fault tolerance |
Settore Scientifico Disciplinare: | Settore INF/01 - Informatica |
Data di pubblicazione: | 2019 |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1109/LATW.2019.8704615 |
Tipologia: | Book Part (author) |
Appare nelle tipologie: | 03 - Contributo in volume |
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