Nanostructured titanium dioxide (ns-TiO2) films were grown by supersonic cluster beam deposition method. Transmission electron microscopy demonstrated that films are mainly composed by TiO2 nanocrystals embedded in an amorphous TiO2 phase while their elec- tronic structure was studied by photoemission spectroscopy. The cluster assembled ns-TiO2 films are expected to exhibit several struc- tural and chemical defects owing to the large surface to volume ratio of the deposited clusters. Ultraviolet photoemission spectra (hv = 50 eV) from the valence band unveil the presence of a restrained amount of surface Ti 3d defect states in the band gap, whereas Ti 2p core level X-ray photoelectron (hv = 630 eV) spectra do not manifestly disclose these defects.
|Titolo:||Photoemission investigations on nanostructured TiO2 grown by cluster assembling|
|Parole Chiave:||Defects; Nanostructures; Photoelectron spectroscopy; Titanium oxide; Transmission electron microscopy|
|Settore Scientifico Disciplinare:||Settore FIS/01 - Fisica Sperimentale|
Settore FIS/03 - Fisica della Materia
|Data di pubblicazione:||2007|
|Digital Object Identifier (DOI):||10.1016/j.susc.2006.12.025|
|Appare nelle tipologie:||01 - Articolo su periodico|