Recently introduced, three-level logic Sum of Pseudoproducts (SPP) forms allow the representation of Boolean functions with much shorter expressions than standard two-level Sum of Products (SOP) forms, or other three-level logic forms. In this paper the testability of circuits derived from SPPs is analyzed. We study testability under the Stuck-At Fault Model (SAFM). For SPP networks several minimal forms can be considered. While full testability can be proved for some classes, others are shown to contain redundancies. Experimental results are given to demonstrate the efficiency of the approach.
|Titolo:||Stuck-at-fault testability of SPP three-level logic forms|
|Parole Chiave:||reliability and testing; testability; design for testability; SPP three-level network|
|Settore Scientifico Disciplinare:||Settore INF/01 - Informatica|
|Data di pubblicazione:||2006|
|Digital Object Identifier (DOI):||10.1007/0-387-33403-3_19|
|Tipologia:||Book Part (author)|
|Appare nelle tipologie:||03 - Contributo in volume|