A low-noise wide-bandwidth charge-sensitive micro-probe is being developed, able to capture the charge signals of semiconductor detectors. The micro-probe works on a single terminated coaxial cable of whatever length, whose quality is key to achieving a good dynamic performance. The cable carries both the power supply (DC signal component) and the event pulses (AC signal component). No power-supply filtering capacitor is required. The micro-probe is particularly compact, consisting of a few devices, including a GΩ surface-mount resistor. Both a discrete-component and an ASIC version are under development. The ASIC version is designed in a 0.35μm 5V CMOS technology and is expected to be fully functional also at cryogenic temperatures. Thanks to such a large degree of integration the micro-probe can be placed very close to the detector electrode and is particularly light, compact and hence suited for hostile environments and for applications where a high radio-purity of the front-end is required, like in rare-decay research in underground laboratories. The rise time of the integrated version, as obtained from computer simulation, is < 1ns with a detector capacitance of 16pF. The energy range is beyond 20 MeV, and the power consumption is ∼35 mW per channel.
Design of an integrated low-noise ultra-fast charge-sensitive micro-probe for semiconductor detectors / A. Pullia, S. Capra, E. Frontini - In: 2012 IEEE nuclear science symposium and medical imaging conference record : (NSS/MIC) October 29-November 3, 2012 : Anaheim, California, USA / [a cura di] B. Yu. - Piscataway : IEEE, 2012. - ISBN 978-1-4673-2030-6. - pp. 4179-4183 (( convegno Nuclear science symposium and medical imaging conference tenutosi a Anaheim, CA, USA nel 2012.
|Titolo:||Design of an integrated low-noise ultra-fast charge-sensitive micro-probe for semiconductor detectors|
PULLIA, ALBERTO (Primo)
CAPRA, STEFANO (Secondo)
|Parole Chiave:||charge sensitive preamplifier ; low noise electronics ; radiation detectors|
|Settore Scientifico Disciplinare:||Settore ING-INF/01 - Elettronica|
Settore FIS/01 - Fisica Sperimentale
Settore FIS/04 - Fisica Nucleare e Subnucleare
|Data di pubblicazione:||2012|
|Enti collegati al convegno:||IEEE|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1109/NSSMIC.2012.6551954|
|Tipologia:||Book Part (author)|
|Appare nelle tipologie:||03 - Contributo in volume|
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