In situ high temperature single crystal X-ray diffraction (XRD) experiments have been performed on a chemically quasi-ideal omphacite sample [(Ca0.49Na0.51)(Σ1)(Mg0.46Al0.48Fe0.063+)(Σ1)(Si1.97 Al0.03)(Σ2)O6], up to 1000°C. The lattice parameters were studied as a function of temperature, and their thermal expansion coefficients determined. The b and c cell edges show discontinuities as a function of temperature which are interpreted here in terms of intracrystalline cation diffusion processes. Structure refinements have been carried out using data collected at room temperature, at 800°C and at ambient conditions after cooling. The structural behaviour as a function of temperature of chemically quasi-ideal omphacites is compared with those of jadeite and diopside.
In situ high temperature single crystal X-ray diffraction study of a natural omphacite / A. Pavese, R. Bocchio, G. Ivaldi. - In: MINERALOGICAL MAGAZINE. - ISSN 0026-461X. - 64:6(2000), pp. 983-993.
|Titolo:||In situ high temperature single crystal X-ray diffraction study of a natural omphacite|
PAVESE, ALESSANDRO (Primo)
BOCCHIO, ROSANGELA (Secondo)
|Settore Scientifico Disciplinare:||Settore GEO/06 - Mineralogia|
|Data di pubblicazione:||2000|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1180/002646100549986|
|Appare nelle tipologie:||01 - Articolo su periodico|