We have investigated the ionization of the Ar atom by 51 nm extreme-ultraviolet light pulses at the free-electron laser facility, SPring-8 Compact SASE Source test accelerator, in Japan. The angle-resolved photoelectron spectra contain lines due to sequential three-photon double ionization with the second ionization step proceeding via the resonantly enhanced two-photon absorption. The relative intensities of the corresponding photoelectron peaks and their angular dependence are explained in the framework of a three-step model of the process.
Photoelectron spectroscopy of sequential three-photon double ionization of Ar irradiated by EUV free-electron laser pulses / H. Fukuzawa, E. V. Gryzlova, K. Motomura, A. Yamada, K. Ueda, A. N. Grum Grzhimailo, S. I. Strakhova, K. Nagaya, A. Sugishima, Y. Mizoguchi, H. Iwayama, M. Yao, N. Saito, P. G. C. Piseri, T. Mazza, M. Devetta, M. Coreno, M. Nagasono, K. Tono, M. Yabashi, T. Ishikawa, H. Ohashi, H. Kimura, T. Togashi, Y. Senba. - In: JOURNAL OF PHYSICS. B, ATOMIC MOLECULAR AND OPTICAL PHYSICS. - ISSN 0953-4075. - 43:11(2010 May 19), pp. 111001.111001.1-111001.111001.4. [10.1088/0953-4075/43/11/111001]
Photoelectron spectroscopy of sequential three-photon double ionization of Ar irradiated by EUV free-electron laser pulses
P.G.C. Piseri;T. Mazza;M. Devetta;
2010
Abstract
We have investigated the ionization of the Ar atom by 51 nm extreme-ultraviolet light pulses at the free-electron laser facility, SPring-8 Compact SASE Source test accelerator, in Japan. The angle-resolved photoelectron spectra contain lines due to sequential three-photon double ionization with the second ionization step proceeding via the resonantly enhanced two-photon absorption. The relative intensities of the corresponding photoelectron peaks and their angular dependence are explained in the framework of a three-step model of the process.
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