The operation of electronic devices in hostile environment has been investigated. Issues due to Extremely Low Temperature (i.e., Cryogenic temperature) and operation in cryogenics liquids (liquid argon, LAr, or liquid nitrogen, LN2) are presented and discussed. Both passive and active electronics components have been considered and their troubles at cryogenics temperature have been presented.

Issues of electronic devices in hostile environment / A. Andreani, M. Lazzaroni, A. Riminucci, D. Santoro, V. Trabattoni, A. Zani. ((Intervento presentato al 35. convegno European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : September, 23rd - 26th tenutosi a Parma nel 2024.

Issues of electronic devices in hostile environment

A. Andreani
Primo
;
M. Lazzaroni
Secondo
;
V. Trabattoni
Penultimo
;
2024

Abstract

The operation of electronic devices in hostile environment has been investigated. Issues due to Extremely Low Temperature (i.e., Cryogenic temperature) and operation in cryogenics liquids (liquid argon, LAr, or liquid nitrogen, LN2) are presented and discussed. Both passive and active electronics components have been considered and their troubles at cryogenics temperature have been presented.
set-2024
Settore IMIS-01/B - Misure elettriche ed elettroniche
Settore PHYS-01/A - Fisica sperimentale delle interazioni fondamentali e applicazioni
https://www.esref2024.org/proceedings
Issues of electronic devices in hostile environment / A. Andreani, M. Lazzaroni, A. Riminucci, D. Santoro, V. Trabattoni, A. Zani. ((Intervento presentato al 35. convegno European Symposium on Reliability of Electron Devices, Failure Physics and Analysis : September, 23rd - 26th tenutosi a Parma nel 2024.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/1103068
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