Noise measurements on high quality devices can be hampered by the unavoidable noise added by the instrument performing the measurement. The paper will briefly discuss the reduction of the instrumental noise achievable by the cross- correlation technique and by the design of custom CMOS amplifiers. Practical applications in the case of nanofiber organic field-effect-transistors and of cryogenic noise measurements are also commented.
High sensitivity noise measurements: Circuits, techniques and applications / G. Ferrari, M. Carminati, G. Gervasoni, M. Sampietro, E. Prati, C. Pennetta, F. Lezzi, D. Pisignano - In: 2015 International Conference on Noise and Fluctuations (ICNF)[s.l] : IEEE, 2015. - ISBN 9781467383356. - pp. 1-6 (( convegno International Conference on Noise and Fluctuations, ICNF tenutosi a Xian nel 2015 [10.1109/ICNF.2015.7288556].
High sensitivity noise measurements: Circuits, techniques and applications
E. Prati;
2015
Abstract
Noise measurements on high quality devices can be hampered by the unavoidable noise added by the instrument performing the measurement. The paper will briefly discuss the reduction of the instrumental noise achievable by the cross- correlation technique and by the design of custom CMOS amplifiers. Practical applications in the case of nanofiber organic field-effect-transistors and of cryogenic noise measurements are also commented.
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