In this work we report on recent two-dimensional (2D) electron beam diagnostics at the NCD-SWEET undulator beamline at the ALBA Synchrotron Light Source with a novel interferometric technique based on X-ray Heterodyne Near Field Speckles. We show that the method is intrinsically 2D and can resolve beam sizes as small as 5 μm. We also discuss relevance to future fourth-generation light sources near the diffraction limit.
Two-dimensional electron beam diagnostics with X-ray heterodyne near field speckles / M. Siano. - In: IL NUOVO CIMENTO C. - ISSN 2037-4909. - 45:6(2022), pp. 211.1-211.4. [10.1393/ncc/i2022-22211-8]
Two-dimensional electron beam diagnostics with X-ray heterodyne near field speckles
M. Siano
2022
Abstract
In this work we report on recent two-dimensional (2D) electron beam diagnostics at the NCD-SWEET undulator beamline at the ALBA Synchrotron Light Source with a novel interferometric technique based on X-ray Heterodyne Near Field Speckles. We show that the method is intrinsically 2D and can resolve beam sizes as small as 5 μm. We also discuss relevance to future fourth-generation light sources near the diffraction limit.File in questo prodotto:
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