In this work we report on recent two-dimensional (2D) electron beam diagnostics at the NCD-SWEET undulator beamline at the ALBA Synchrotron Light Source with a novel interferometric technique based on X-ray Heterodyne Near Field Speckles. We show that the method is intrinsically 2D and can resolve beam sizes as small as 5 μm. We also discuss relevance to future fourth-generation light sources near the diffraction limit.

Two-dimensional electron beam diagnostics with X-ray heterodyne near field speckles / M. Siano. - In: IL NUOVO CIMENTO C. - ISSN 2037-4909. - 45:6(2022), pp. 211.1-211.4. [10.1393/ncc/i2022-22211-8]

Two-dimensional electron beam diagnostics with X-ray heterodyne near field speckles

M. Siano
2022

Abstract

In this work we report on recent two-dimensional (2D) electron beam diagnostics at the NCD-SWEET undulator beamline at the ALBA Synchrotron Light Source with a novel interferometric technique based on X-ray Heterodyne Near Field Speckles. We show that the method is intrinsically 2D and can resolve beam sizes as small as 5 μm. We also discuss relevance to future fourth-generation light sources near the diffraction limit.
Settore FIS/03 - Fisica della Materia
https://www.sif.it/riviste/sif/ncc/econtents/2022/045/06/article/54
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/936356
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