Beamline 11.3.1 at the Advanced Light Source is a tender/hard (6-17 keV) x-ray bend magnet beamline recently re-purposed with a new full-field, nanoscale transmission x-ray microscope. The microscope is designed to image composite and porous materials possessing a submicrometer structure and compositional heterogeneity that determine materials' performance and geologic behavior. The theoretical and achieved resolutions are 55 and < 100 nm, respectively. The microscope is used in tandem with a mu m spot of interest on the sample, followed by a phase-type zone plate magnifying objective of & SIM;52 mu m field of view and a phase detection ring. The zone plate serves as the system objective and magnifies the sample with projection onto an indirect x-ray detection system, consisting of a polished single crystal CsI(Tl) scintillator and a range of high-quality Plan Fluorite visible light objectives. The objectives project the final visible light image onto a water-cooled CMOS 2048 x 2048-pixel(2) detector. Here, we will discuss the salient features of this instrument and describe early results from imaging the internal three-dimensional microstructure and nanostructure of target materials, including fiber-reinforced composites and geomaterials.
The hard x-ray nanotomography microscope at the advanced light source / J.B. Nichols, M. Voltolini, B. Gilbert, A.A. Macdowell, M.W. Czabaj. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 93:2(2022), pp. 023704.023704-1-023704.023704-10. [10.1063/5.0076322]
The hard x-ray nanotomography microscope at the advanced light source
M. VoltoliniSecondo
;
2022
Abstract
Beamline 11.3.1 at the Advanced Light Source is a tender/hard (6-17 keV) x-ray bend magnet beamline recently re-purposed with a new full-field, nanoscale transmission x-ray microscope. The microscope is designed to image composite and porous materials possessing a submicrometer structure and compositional heterogeneity that determine materials' performance and geologic behavior. The theoretical and achieved resolutions are 55 and < 100 nm, respectively. The microscope is used in tandem with a mu m spot of interest on the sample, followed by a phase-type zone plate magnifying objective of & SIM;52 mu m field of view and a phase detection ring. The zone plate serves as the system objective and magnifies the sample with projection onto an indirect x-ray detection system, consisting of a polished single crystal CsI(Tl) scintillator and a range of high-quality Plan Fluorite visible light objectives. The objectives project the final visible light image onto a water-cooled CMOS 2048 x 2048-pixel(2) detector. Here, we will discuss the salient features of this instrument and describe early results from imaging the internal three-dimensional microstructure and nanostructure of target materials, including fiber-reinforced composites and geomaterials.File | Dimensione | Formato | |
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