Si transistors with deterministically implanted donors were fabricated by single-ion implantation method and their quantum transport was investigated. By placing donors in one dimensional array, we observed the transport characteristics categorized into two regimes: single-electron tunneling through isolated D 0 and D - states; Hubbard band formation due to the inter-donor coupling.

Quantum transport in deterministically implanted single-donors in Si FETs / T. Shinada, M. Hori, F. Guagliardo, G. Ferrari, A. Komatubara, K. Kumagai, T. Tanii, T. Endo, Y. Ono, E. Prati (TECHNICAL DIGEST - INTERNATIONAL ELECTRON DEVICES MEETING). - In: 2011 International Electron Devices Meeting[s.l] : IEEE, 2011. - ISBN 978-145770505-2. - pp. 697-700 (( convegno International Electron Devices Meeting tenutosi a Washington nel 2011 [10.1109/IEDM.2011.6131644].

Quantum transport in deterministically implanted single-donors in Si FETs

E. Prati
Ultimo
2011

Abstract

Si transistors with deterministically implanted donors were fabricated by single-ion implantation method and their quantum transport was investigated. By placing donors in one dimensional array, we observed the transport characteristics categorized into two regimes: single-electron tunneling through isolated D 0 and D - states; Hubbard band formation due to the inter-donor coupling.
English
Single ion implantation; Hubabrd bands
Settore FIS/03 - Fisica della Materia
Intervento a convegno
Esperti anonimi
Pubblicazione scientifica
2011 International Electron Devices Meeting
IEEE
2011
697
700
4
978-145770505-2
Volume a diffusione internazionale
International Electron Devices Meeting
Washington
2011
miur
MIUR-MANUAL
NON aderisco
T. Shinada, M. Hori, F. Guagliardo, G. Ferrari, A. Komatubara, K. Kumagai, T. Tanii, T. Endo, Y. Ono, E. Prati
Book Part (author)
none
273
Quantum transport in deterministically implanted single-donors in Si FETs / T. Shinada, M. Hori, F. Guagliardo, G. Ferrari, A. Komatubara, K. Kumagai, T. Tanii, T. Endo, Y. Ono, E. Prati (TECHNICAL DIGEST - INTERNATIONAL ELECTRON DEVICES MEETING). - In: 2011 International Electron Devices Meeting[s.l] : IEEE, 2011. - ISBN 978-145770505-2. - pp. 697-700 (( convegno International Electron Devices Meeting tenutosi a Washington nel 2011 [10.1109/IEDM.2011.6131644].
info:eu-repo/semantics/bookPart
10
Prodotti della ricerca::03 - Contributo in volume
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/908839
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