The effect of the geometrical confinement on the shell filling in quantum dots obtained in silicon-on-insulator (SOI) tri-sided gate metal oxide semiconductor single-electron transistors (MOSSETs) is investigated on the basis of the current spin density functional theory. Variations of the geometric shape in nanowire SOI-MOSSETs with square section entail important changes in the valley filling sequences, whereas the variability of the gate length does not imply a significant modification of the filling patterns. Our results provide quantitative insights towards the shell engineering of silicon quantum dots for qubits with stable valley filling patterns.

Geometrical Effects on Valley-Orbital Filling Patterns in Silicon Quantum Dots for Robust Qubit Implementation / M. De Michielis, E. Prati, M. Fanciulli, G. Fiori, G. Iannaccone. - In: APPLIED PHYSICS EXPRESS. - ISSN 1882-0778. - 5:12(2012), pp. 124001.1-124001.3. [10.1143/APEX.5.124001]

Geometrical Effects on Valley-Orbital Filling Patterns in Silicon Quantum Dots for Robust Qubit Implementation

E. Prati
Secondo
;
2012

Abstract

The effect of the geometrical confinement on the shell filling in quantum dots obtained in silicon-on-insulator (SOI) tri-sided gate metal oxide semiconductor single-electron transistors (MOSSETs) is investigated on the basis of the current spin density functional theory. Variations of the geometric shape in nanowire SOI-MOSSETs with square section entail important changes in the valley filling sequences, whereas the variability of the gate length does not imply a significant modification of the filling patterns. Our results provide quantitative insights towards the shell engineering of silicon quantum dots for qubits with stable valley filling patterns.
No
English
Settore FIS/03 - Fisica della Materia
Articolo
Esperti anonimi
Ricerca di base
Pubblicazione scientifica
2012
5
12
124001
1
3
3
Pubblicato
Periodico con rilevanza internazionale
miur
MIUR-MANUAL
NON aderisco
info:eu-repo/semantics/article
Geometrical Effects on Valley-Orbital Filling Patterns in Silicon Quantum Dots for Robust Qubit Implementation / M. De Michielis, E. Prati, M. Fanciulli, G. Fiori, G. Iannaccone. - In: APPLIED PHYSICS EXPRESS. - ISSN 1882-0778. - 5:12(2012), pp. 124001.1-124001.3. [10.1143/APEX.5.124001]
none
Prodotti della ricerca::01 - Articolo su periodico
5
262
Article (author)
no
M. De Michielis, E. Prati, M. Fanciulli, G. Fiori, G. Iannaccone
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/908715
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