The textures of an Al thin film and of alpha-MnS nanocrystals deposited on a carbon film grid have been analysed using powder electron diffraction. For each sample a series of powder electron diffraction patterns tilted with respect to two orthogonal axes were collected, to adapt to this type of data the texture analysis procedures commonly used in synchrotron X-ray transmission geometry. Both pattern sets have been analysed with the Rietveld procedure embedded in the software MAUD. The fit is satisfactory with agreement factors of 7.03% for the Al film and 3.42% for alpha-MnS and reveals in both cases a (111) preferred orientation with a pronounced cylindrical symmetry. The (111) and (100) pole figures, plotted in terms of multiples of random distribution (m.r.d.), show a fairly strong lattice preferred orientation in the Al thin film and a stronger one in the deposited alpha-MnS nanocrystals, with maxima, for the (111) pole figures, of 8.8 and 19.7 m.r.d., respectively.
Quantitative texture analysis from powder-like electron diffraction data / M. Gemmi, M. Voltolini, A.M. Ferretti, A. Ponti. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - 44:3(2011 Jun), pp. 454-461. [10.1107/S0021889811012106]
Quantitative texture analysis from powder-like electron diffraction data
M. Gemmi
Primo
;M. VoltoliniSecondo
;A.M. FerrettiPenultimo
;A. PontiUltimo
2011
Abstract
The textures of an Al thin film and of alpha-MnS nanocrystals deposited on a carbon film grid have been analysed using powder electron diffraction. For each sample a series of powder electron diffraction patterns tilted with respect to two orthogonal axes were collected, to adapt to this type of data the texture analysis procedures commonly used in synchrotron X-ray transmission geometry. Both pattern sets have been analysed with the Rietveld procedure embedded in the software MAUD. The fit is satisfactory with agreement factors of 7.03% for the Al film and 3.42% for alpha-MnS and reveals in both cases a (111) preferred orientation with a pronounced cylindrical symmetry. The (111) and (100) pole figures, plotted in terms of multiples of random distribution (m.r.d.), show a fairly strong lattice preferred orientation in the Al thin film and a stronger one in the deposited alpha-MnS nanocrystals, with maxima, for the (111) pole figures, of 8.8 and 19.7 m.r.d., respectively.File | Dimensione | Formato | |
---|---|---|---|
cg5175.pdf
solo utenti autorizzati
Tipologia:
Publisher's version/PDF
Dimensione
930.06 kB
Formato
Adobe PDF
|
930.06 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.