We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays / A. Niozu, Y. Kumagai, T. Nishiyama, H. Fukuzawa, K. Motomura, M. Bucher, Y. Ito, T. Takanashi, K. Asa, Y. Sato, D. You, Y. Li, T. Ono, E. Kukk, C. Miron, L. Neagu, C. Callegari, M.D. Fraia, G. Rossi, D.E. Galli, T. Pincelli, A. Colombo, T. Kameshima, Y. Joti, T. Hatsui, S. Owada, T. Katayama, T. Togashi, K. Tono, M. Yabashi, K. Matsuda, C. Bostedt, K. Nagaya, K. Ueda. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 1412:20(2020), pp. 202028.1-202028.2. ((Intervento presentato al convegno 31st International Conference on Photonic, Electronic and Atomic Collisions, ICPEAC 2019 tenutosi a Deauville International Conference Centre, fra nel 2019 [10.1088/1742-6596/1412/20/202028].
Characterizing crystalline defects in single Xe nanoparticles from angular correlations of single-shot diffracted X-rays
G. Rossi;D.E. Galli;T. Pincelli;A. Colombo;
2020
Abstract
We performed a wide-angle X-ray scattering experiment of single Xe nanoparticles using an X-ray free electron laser. We developed a novel analysis method that focuses on the angular correlation between plural Bragg spots in single-shot diffraction patterns. The angular correlations of the Bragg spots encode rich structural information and offer an evidence of twinning and stacking faults in Xe nanoparticles.
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