Characterizing and controlling the uniformity of nanoparticles is crucial for their application in science and technology because crystalline defects in the nanoparticles strongly affect their unique properties. Recently, ultra-short and ultra-bright X-ray pulses provided by X-ray free-electron lasers (XFELs) opened up the possibility of structure determination of nanometre-scale matter with A ˚ spatial resolution. However, it is often difficult to reconstruct the 3D structural information from single-shot X-ray diffraction patterns owing to the random orientation of the particles. This report proposes an analysis approach for characterizing defects in nanoparticles using wide-angle X-ray scattering (WAXS) data from free-flying single nanoparticles. The analysis method is based on the concept of correlated X-ray scattering, in which correlations of scattered X-ray are used to recover detailed structural information. WAXS experiments of xenon nanoparticles, or clusters, were conducted at an XFEL facility in Japan by using the SPring-8 A ˚ ngstrom compact free-electron laser (SACLA). Bragg spots in the recorded single-shot X-ray diffraction patterns showed clear angular correlations, which offered significant structural information on the nanoparticles. The experimental angular correlations were reproduced by numerical simulation in which kinematical theory of diffraction was combined with geometric calculations.We also explain the diffuse scattering intensity as being due to the stacking faults in the xenon clusters.
Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays / A. Niozu∗, Y. Kumagai, T. Nishiyama, H. Fukuzawa, K. Motomura, M. Bucher, K. Asa, Y. Sato, Y. Ito, T. Takanashi, D. You, T. Ono, Y. Li, E. Kukk, C. Miron, L. Neagu, C. Callegari, M. Di Fraia, G. ROSSI, D.E. Galli, T. PINCELLI, A. COLOMBO, S. Owada, K. Tono, T. Kameshima, Y. Joti, T. Katayama, T. Togashi, M. Yabashi, K. Matsuda, K. Nagaya, C. Bostedtd, A. Kiyoshi Ueda. - In: IUCRJ. - ISSN 2052-2525. - 7:2(2020 Mar), pp. 276-286.
|Titolo:||Characterizing crystalline defects in single nanoparticles from angular correlations of single-shot diffracted X-rays|
|Parole Chiave:||X-ray diffraction; X-ray scattering; structure determination; single nanoparticles; crystalline defects; XFELs; angular correlations; stacking faults|
|Settore Scientifico Disciplinare:||Settore FIS/03 - Fisica della Materia|
|Progetto:||NOXSS (X-ray Single Shots of Nano Objects) un approccio sperimentale e teorico integrato per la caratterizzazione strutturale di nano e micro oggetti (clusters, nanocristalli, biomolecole, virus, liposomi) utilizzando gli impulsi X ultrabrevi ed ultrabrillanti delle sorgenti free electron laser europee|
|Data di pubblicazione:||mar-2020|
|Data ahead of print / Data di stampa:||2019|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1107/S205225252000144X|
|Appare nelle tipologie:||01 - Articolo su periodico|