In this paper a method for disentangling the various noise components in semiconductor radiation detector-amplifier systems is described and experimentally tested. A charge amplification scheme is adopted for the measurements. It is shown how an accurate estimate of the series and parallel white noise, 1/f series noise, and f parallel noise can be quickly obtained through a multiparameter least-squares interpolation of the equivalent noise charge data of the system.
A method for the determination of the noise parameters in preamplifying systems for semiconductor radiation detectors / G. Bertuccio, A. Pullia. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 64:11(1993), pp. 3294-3298.
A method for the determination of the noise parameters in preamplifying systems for semiconductor radiation detectors
A. Pullia
1993
Abstract
In this paper a method for disentangling the various noise components in semiconductor radiation detector-amplifier systems is described and experimentally tested. A charge amplification scheme is adopted for the measurements. It is shown how an accurate estimate of the series and parallel white noise, 1/f series noise, and f parallel noise can be quickly obtained through a multiparameter least-squares interpolation of the equivalent noise charge data of the system.File | Dimensione | Formato | |
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