This paper presents the design of a charge sensitive amplifier (CSA) for an analog processing circuit of 47×6 silicon pixel detector array. The design has been implemented in BCD 180 nm technology. A diode with an area of 250 × 50 µm2 is used to realize a unit sensor pixel. A 100 % fill factor is achieved by confining the analog circuit in the diode. Low power and area efficient single ended folded cascode amplifier is employed as a basic building block of the CSA. Further, an on-chip corner control circuit is proposed to make the design insensitive to process variations and to reduce power dissipation in the CSA.
Design of a charge sensitive amplifier for silicon particle detector in BCD 180 nm process / I. Yadav, A. Joshi, E. Ruscino, V. Liberali, A. Andreazza, H. Shrimali - In: 2019 32nd International Conference on VLSI Design and 2019 18th International Conference on Embedded Systems (VLSID)[s.l] : IEEE, 2019 Jan. - ISBN 9781728104096. - pp. 541-542 (( Intervento presentato al 32. convegno International Conference on VLSI Design tenutosi a Delhi nel 2019.
Design of a charge sensitive amplifier for silicon particle detector in BCD 180 nm process
V. Liberali;A. Andreazza;H. Shrimali
2019
Abstract
This paper presents the design of a charge sensitive amplifier (CSA) for an analog processing circuit of 47×6 silicon pixel detector array. The design has been implemented in BCD 180 nm technology. A diode with an area of 250 × 50 µm2 is used to realize a unit sensor pixel. A 100 % fill factor is achieved by confining the analog circuit in the diode. Low power and area efficient single ended folded cascode amplifier is employed as a basic building block of the CSA. Further, an on-chip corner control circuit is proposed to make the design insensitive to process variations and to reduce power dissipation in the CSA.File | Dimensione | Formato | |
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