This paper presents an approach for simulation of mixed-signal CMOS integrated circuits, aiming at estimating crosstalk effects, by identifying possible sources of disturbances in analog-digital integrated systems, such as current pulses drawn from voltage supplies. A simple expression of voltage and current in the pull-up and the pull-down of a CMOS logic gate can be derived. A computer program demonstrates the feasibility of the proposed approach, and a representation of digital switching noise in frequency domain has been derived.
An analysis of current waveforms in CMOS logic cells for RF mixed circuits / G. Trucco, G. Boselli, V. Liberali - In: 2004 24. International conference on microelectronics : proceedings. 2. / [a cura di] [s.n.]. - Piscataway : Institute of electrical and electronics engineers, 2004. - ISBN 0780381661. - pp. 563-566 (( Intervento presentato al 24. convegno International Conference on Microelectronics (MIEL) tenutosi a Nis, Serbia and Montenegro nel 2004.
An analysis of current waveforms in CMOS logic cells for RF mixed circuits
G. TruccoPrimo
;G. BoselliSecondo
;V. LiberaliUltimo
2004
Abstract
This paper presents an approach for simulation of mixed-signal CMOS integrated circuits, aiming at estimating crosstalk effects, by identifying possible sources of disturbances in analog-digital integrated systems, such as current pulses drawn from voltage supplies. A simple expression of voltage and current in the pull-up and the pull-down of a CMOS logic gate can be derived. A computer program demonstrates the feasibility of the proposed approach, and a representation of digital switching noise in frequency domain has been derived.
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