The semiconducting and electrical properties of as-deposited and ex-situ irradiated hybrid films on FTO and enriched in Cu 2024-T3 Al alloy substrates, using hydrolyzed solutions of pyrrolyl- (PySi) and anilinyl-silicon (AnSi) compounds, were investigated by means of photocurrent (PCS) and electrochemical impedance (EIS) spectroscopies. AnSi based film is p-type semiconducting while PySi is n-type due to OH-π interactions and charge pinning by silanol (SiOH). The electrical properties depend on the extent and nature of donor-acceptor complexes developed in solution, as well as on the propensity towards Cu+(π-ligand) coordination during the surface treatment step. The aniline derivative is more prone to Cu-π(N) complexation, which imparts stability to the buried interface. This, however, turns reactive in the presence of aggressive Cl− due to displacement reactions as the penetration of these species throughout the p-type semiconducting AnSi films is facilitated, contrariwise to the n-type PySi film.
Semiconducting and electrical properties of thin hybrid films from pyrrolyl- and anilynyl-silicon precursors / M. Trueba, S.P. Trasatti. - In: MATERIALS CHEMISTRY AND PHYSICS. - ISSN 0254-0584. - 217(2018 Sep 15), pp. 54-62.
|Titolo:||Semiconducting and electrical properties of thin hybrid films from pyrrolyl- and anilynyl-silicon precursors|
TRUEBA, MONICA (Primo) (Corresponding)
TRASATTI, STEFANO PIERPAOLO MARCELLO (Ultimo)
|Parole Chiave:||corrosion protection; electrical properties; organic-inorganic hybrid films; semiconducting properties|
|Settore Scientifico Disciplinare:||Settore ING-IND/23 - Chimica Fisica Applicata|
Settore ING-IND/22 - Scienza e Tecnologia dei Materiali
|Data di pubblicazione:||15-set-2018|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/j.matchemphys.2018.06.042|
|Appare nelle tipologie:||01 - Articolo su periodico|