We use Co atoms dispersed in a ferromagnetic Fe film as a magnetic marker material to probe the magnetic properties of the Fe film grown epitaxially on GaAs (001) - (4Ã6). X-ray magnetic circular dichroism on Co L2,3 edges has been used to perform, in a Mössbauer-like experiment, a layer-dependent analysis. We find an enhancement of the Co orbital magnetic moment near the interface with the GaAs substrate, as well as a decrease of the spin magnetic moment when approaching the interface and at the surface of the Fe film.
Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6) / L. Giovanelli, G. Panaccione, G. Rossi, M. Fabrizioli, C.S. Tian, P.L. Gastelois, J. Fujii, C.H. Back. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 87:4(2005), pp. 042506.1-042506.3.
Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6)
G. Rossi;
2005
Abstract
We use Co atoms dispersed in a ferromagnetic Fe film as a magnetic marker material to probe the magnetic properties of the Fe film grown epitaxially on GaAs (001) - (4Ã6). X-ray magnetic circular dichroism on Co L2,3 edges has been used to perform, in a Mössbauer-like experiment, a layer-dependent analysis. We find an enhancement of the Co orbital magnetic moment near the interface with the GaAs substrate, as well as a decrease of the spin magnetic moment when approaching the interface and at the surface of the Fe film.
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