The splitting of the free ion ground state of rare-earths can be investigated using X-ray absorption spectroscopy with polarized light at the M4.5-edges. The linear polarization of the light, combined with the dipole selection rules, allows one to study the ordering and separation of the crystal field levels over an energy range of a few meV, even using 1 keV photons with 1 eV energy resolution. Thanks to the high absorption cross section and to the elemental selectivity, this technique is particularly suited for surface studies.
Surface X-ray dichroism for crystal field studies / M. Sacchi, O. Sakho, F. Sirotti, G. Rossi. - In: APPLIED SURFACE SCIENCE. - ISSN 0169-4332. - 56-58:Part 1(1992), pp. 1-5. ((Intervento presentato al 3. convegno International Conf on the formation of semiconductor interfaces ( ICFSI-3 ) tenutosi a Roma nel 1991.
Surface X-ray dichroism for crystal field studies
G. Rossi
1992
Abstract
The splitting of the free ion ground state of rare-earths can be investigated using X-ray absorption spectroscopy with polarized light at the M4.5-edges. The linear polarization of the light, combined with the dipole selection rules, allows one to study the ordering and separation of the crystal field levels over an energy range of a few meV, even using 1 keV photons with 1 eV energy resolution. Thanks to the high absorption cross section and to the elemental selectivity, this technique is particularly suited for surface studies.
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