We present measurements of photoelectron flux from the 4d band of Pd in the photon energy range 70-200eV. A comparison between measurements at different light incidence angles demonstrates the effect of the optical corrections (reflectivity and refraction) needed in the measurement of photoionization cross sections. It is shown that simple model calculations account satisfactorily for this effect.
Optical corrections in measurements of photoionization cross sections from solids in the soft X-ray range / U. Del Pennino, S. Nannarone, L. Braicovich, I. Abbati, G. Rossi, I. Lindau. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 37:3(1986), pp. 389-393.
Optical corrections in measurements of photoionization cross sections from solids in the soft X-ray range
G. RossiPenultimo
;
1986
Abstract
We present measurements of photoelectron flux from the 4d band of Pd in the photon energy range 70-200eV. A comparison between measurements at different light incidence angles demonstrates the effect of the optical corrections (reflectivity and refraction) needed in the measurement of photoionization cross sections. It is shown that simple model calculations account satisfactorily for this effect.
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