The valency changeover in Sm overlayers on Si(111)7Ã7 is probed with high accuracy using x-ray-absorption spectroscopy at the Sm M4,5 edges. The valency of Sm has been studied as a function of the layer thickness in the chemisorption regime, and compared with the results obtained for epitaxially grown samarium silicide layers.
Valency changeover in Sm layers on Si(111)7×7 studied with soft-x-ray-absorption spectroscopy / O. Sakho, M. Sacchi, F. Sirotti, G. Rossi. - In: PHYSICAL REVIEW. B, CONDENSED MATTER. - ISSN 0163-1829. - 47:7(1993), pp. 3797-3801.
Valency changeover in Sm layers on Si(111)7×7 studied with soft-x-ray-absorption spectroscopy
G. Rossi
1993
Abstract
The valency changeover in Sm overlayers on Si(111)7Ã7 is probed with high accuracy using x-ray-absorption spectroscopy at the Sm M4,5 edges. The valency of Sm has been studied as a function of the layer thickness in the chemisorption regime, and compared with the results obtained for epitaxially grown samarium silicide layers.
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