X-ray absorption at the SmM4,5edges and photoemission spectroscopies allow to probe with very high sensitivity the valence changes in Sm overlayers on Si(111)7 x 7.
Valency changeover at the Sm/Si(111)7x7 interface through chemisorption and epitaxy / O. Sakho, M. De Santis, M. Sacchi, F. Sirotti, G. Rossi. - In: APPLIED SURFACE SCIENCE. - ISSN 0169-4332. - 65-66:C(1993), pp. 729-734. ((Intervento presentato al 6. convegno International Conference on Solid films and surfaces tenutosi a Paris nel 1992.
Valency changeover at the Sm/Si(111)7x7 interface through chemisorption and epitaxy
G. RossiUltimo
1993
Abstract
X-ray absorption at the SmM4,5edges and photoemission spectroscopies allow to probe with very high sensitivity the valence changes in Sm overlayers on Si(111)7 x 7.File in questo prodotto:
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