Photoemission spectroscopy using synchrotron radiation and excitation energies around the Cooper minimum have been applied to studies of the nature of the bonding in SiPd and SiPt interfaces. Evidence is presented that breaking of the tetrahedral coordination in Si and the Si-metal interaction introduces new valence states in the interface region. The energy positron and the orbital character of these Si-metal mixed valence states are determined. A suggestion is made how these results can be generalized to other Si-transition metal interfaces.

Nature of the valence states in silicon transition metal interfaces / G. Rossi, I. Abbati, L. Braicovich, I. Lindau, W.E. Spicer. - In: SOLID STATE COMMUNICATIONS. - ISSN 0038-1098. - 39:2(1981), pp. 195-198.

Nature of the valence states in silicon transition metal interfaces

G. Rossi
Primo
;
1981

Abstract

Photoemission spectroscopy using synchrotron radiation and excitation energies around the Cooper minimum have been applied to studies of the nature of the bonding in SiPd and SiPt interfaces. Evidence is presented that breaking of the tetrahedral coordination in Si and the Si-metal interaction introduces new valence states in the interface region. The energy positron and the orbital character of these Si-metal mixed valence states are determined. A suggestion is made how these results can be generalized to other Si-transition metal interfaces.
Chemistry (all); Condensed Matter Physics; Materials Chemistry2506 Metals and Alloys
Settore FIS/03 - Fisica della Materia
1981
Article (author)
File in questo prodotto:
Non ci sono file associati a questo prodotto.
Pubblicazioni consigliate

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/555022
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 48
  • ???jsp.display-item.citation.isi??? 51
social impact