We describe briefly the principles of the extended X-ray absorption fine structure (EXAFS) technique and discuss in what conditions it can be applied to the local crystallographic study of a clean surface or a surface covered with an adsorbate. Then we present two experiments: a total yield SEXAFS study of cobalt adsorbed on copper(111) and Auger SEXAFS study of an amorphized clean surface of silicon. In both cases we discuss what kind of information can be deduced.
Crystallographic properties and adsorbate geometries by surface EXAFS / D. Chandesris, P. Roubin, G. Rossi, J. Lecante. - In: SURFACE SCIENCE. - ISSN 0039-6028. - 169:1(1986), pp. 57-70.
Crystallographic properties and adsorbate geometries by surface EXAFS
G. Rossi;
1986
Abstract
We describe briefly the principles of the extended X-ray absorption fine structure (EXAFS) technique and discuss in what conditions it can be applied to the local crystallographic study of a clean surface or a surface covered with an adsorbate. Then we present two experiments: a total yield SEXAFS study of cobalt adsorbed on copper(111) and Auger SEXAFS study of an amorphized clean surface of silicon. In both cases we discuss what kind of information can be deduced.
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