In order to improve the resolution in mass identification, we have applied digital signal processing to time of flight measurements directly acquaring silicon detector and RF pulse forms. In the present contribution, we report the results obtained at different sampling frequencies (mass identification up to A=33 for the reaction products produced by a 20.5 AMeV 20Ne beam on 27Al target).
High resolution mass identification using a 100MS/s sampling ADC / P. Guazzoni, F. Amorini, A. Anzalone, R. Bassini, C. Boiano, G. Cardella, S. Cavallaro, E. De Filippo, E. La Guidara, G. Lanzanò, A. Pagano, M. Papa, S. Pirrone, G. Politi, F. Porto, F. Riccio, F. Rizzo, S. Russo, P. Russotto, L. Zetta - In: Proceedings of the IWM2007 : international workshop on multifragmentation and related topics / [a cura di] B. Borderie, J. Frankland, A. Pagano, S. Pirrone, F. Rizzo. - [s.l] : SIF Edizioni Scientifiche, 2008 Jun. - ISBN 9788874380428. - pp. 149-155 (( Intervento presentato al 4. convegno IWM : international workshop on multifragmentation and related topics tenutosi a Caen (France) nel 2007.
High resolution mass identification using a 100MS/s sampling ADC
P. GuazzoniPrimo
;L. ZettaUltimo
2008
Abstract
In order to improve the resolution in mass identification, we have applied digital signal processing to time of flight measurements directly acquaring silicon detector and RF pulse forms. In the present contribution, we report the results obtained at different sampling frequencies (mass identification up to A=33 for the reaction products produced by a 20.5 AMeV 20Ne beam on 27Al target).
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