The Atomic Force Microscope (AFM) is able to image the surface properties of all types of materials (conductors, insulators, biological and vegetal samples) with a very high resolution and in the native state. In particular, AFM is used to study a number of biologic system such as DNA-replication and protein/ protein, DNA/protein interactions; furthermore, in cosmetology, it's suitable to study the fundamental characteristics of the skin, like elasticity and wrinkledness, and to compare for example morphological properties of human virgin hair and chemical or polymer treated hair. The most important characteristics of this instrument in cosmetological analyses are: • the samples can be directely examined without previus treatment, i.e. in native conditions, • data are collect in a digital form, • 3-D image rendering with variable magnification and shading, • view of the recorded image from any point of the space. In our laboratory we analyse numerous samples of cosmetic interest and in particular human hair and replica of human skin. In this short paper we present preliminary data on human vergin hairs.
Potential Applications of AFM (Atomic Force Microscopy) in Cosmetology / B. Berra, G. Poletti, A. Pozzi, S. Zava. - In: JOURNAL OF APPLIED COSMETOLOGY. - ISSN 0392-8543. - 19:3(2001), pp. 89-97.
|Titolo:||Potential Applications of AFM (Atomic Force Microscopy) in Cosmetology|
BERRA, BRUNO (Primo)
POLETTI, GIULIO (Secondo)
ZAVA, STEFANIA (Ultimo)
|Settore Scientifico Disciplinare:||Settore BIO/10 - Biochimica|
Settore FIS/01 - Fisica Sperimentale
|Data di pubblicazione:||2001|
|Appare nelle tipologie:||01 - Articolo su periodico|