This paper proposes a design methodology for a digital library of cells resistant to cosmic radiation. Most important effects due to radiation are avoided or mitigated using ad hoc design techniques. Fault injection techniques are used to validate the design. Simulations results demonstrate that the cells designed in a 180 nm CMOS technology are tolerant to 1.5 mA current peak due to interaction with a single high-energy particle.

Design of a rad-hard library of digital cells for space applications / A. Stabile, V. Liberali, C. Calligaro - In: ICECS 2008 : 15th IEEE international conference on electronics, circuits and systemsPiscataway : Institute of electrical and electronics engineers, 2008 Sep. - ISBN 9781424421827. - pp. 149-152 (( Intervento presentato al 15. convegno ICECS : IEEE International Conference on Electronics, Circuits and Systems tenutosi a Malta nel 2008 [10.1109/ICECS.2008.4674813].

Design of a rad-hard library of digital cells for space applications

A. Stabile
Primo
;
V. Liberali
Secondo
;
2008

Abstract

This paper proposes a design methodology for a digital library of cells resistant to cosmic radiation. Most important effects due to radiation are avoided or mitigated using ad hoc design techniques. Fault injection techniques are used to validate the design. Simulations results demonstrate that the cells designed in a 180 nm CMOS technology are tolerant to 1.5 mA current peak due to interaction with a single high-energy particle.
CMOS digital integrated circuits; cosmic background radiation; logic design; logic gates; radiation effects; design methodology; radiation; rad-hard; single event effect; fault injection
Settore ING-INF/01 - Elettronica
set-2008
Institute of electrical and electronics engineers
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/50791
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