This paper presents a methodology for the characterization and the industrial testing of a very complex Application-Specific Integrated Circuit (ASIC). The proposed test system is being installed at a company and it is very user friendly also for a non specialized operator. This framework has been developed within a collaboration by the Istituto Nazionale di Fisica Nucleare (INFN) and the Laboratoire de Physique Nucléaire et de Hautes Energies (LPNHE), and the same test setup is installed in the laboratories of INFN-Milan, INFN-Frascati and LPNHE-Paris.

Characterization and volume test of the AM06 chip / S.R. Shojaii, A. Annovi, D. Banfi, M. Beretta, F. Crescioli, L. Frontini, V. Liberali, L. Marcellino, A. Stabile - In: New Perspectives in Measurements, Tools and Techniques for Systems Reliability, Maintainability and Safety[s.l] : IMEKO-International Measurement Federation Secretariat, 2016 Jun. - pp. 32-35 (( Intervento presentato al 14. convegno New Perspectives in Measurements, Tools and Techniques for Systems Reliability, Maintainability and Safety tenutosi a Milano nel 2016.

Characterization and volume test of the AM06 chip

L. Frontini;V. Liberali;A. Stabile
2016-06

Abstract

This paper presents a methodology for the characterization and the industrial testing of a very complex Application-Specific Integrated Circuit (ASIC). The proposed test system is being installed at a company and it is very user friendly also for a non specialized operator. This framework has been developed within a collaboration by the Istituto Nazionale di Fisica Nucleare (INFN) and the Laboratoire de Physique Nucléaire et de Hautes Energies (LPNHE), and the same test setup is installed in the laboratories of INFN-Milan, INFN-Frascati and LPNHE-Paris.
Industrial and Manufacturing Engineering
Settore ING-INF/01 - Elettronica
ALLDATA
CalPower
et al.
GMSL
National Instruments
ST
Book Part (author)
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2434/470618
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