The increasing demand for efficiency and quality greatly influences the way in which assets and services are produced and managed. As a consequence, the maintenance of equipment is one of the key drivers for increasing the competitiveness in the market nowadays. This paper introduces ESA (Electric Signature Analysis), a technique that can act as a low cost and reliable tool for diagnostics and, for some applications, prognostics purpose. The effectiveness of the technique is discussed and, finally, demonstrated in a case study carried out for the monitoring of a Photovoltaic (PV) plant.

Maintenance scheduling by means of electrical signature analysis technology / M. Faifer, S. Ierace, M. Lazzaroni - In: Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together[s.l] : IMEKO-International Measurement Federation Secretariat, 2014. - ISBN 9789299007327. - pp. 574-579 (( convegno 20th IMEKO TC4 Symposium on Measurements of Electrical Quantities: Research on Electrical and Electronic Measurement for the Economic Upturn, Together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC 2014 tenutosi a Benevento nel 2014.

Maintenance scheduling by means of electrical signature analysis technology

M. Lazzaroni
Ultimo
2014

Abstract

The increasing demand for efficiency and quality greatly influences the way in which assets and services are produced and managed. As a consequence, the maintenance of equipment is one of the key drivers for increasing the competitiveness in the market nowadays. This paper introduces ESA (Electric Signature Analysis), a technique that can act as a low cost and reliable tool for diagnostics and, for some applications, prognostics purpose. The effectiveness of the technique is discussed and, finally, demonstrated in a case study carried out for the monitoring of a Photovoltaic (PV) plant.
Electrical and Electronic Engineering; Modeling and Simulation; Instrumentation
Settore ING-INF/07 - Misure Elettriche e Elettroniche
2014
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/453734
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