The crystal structure of fluoborite [Mg3F3(BO3)] was refined by Dal Negro and Tadini (1974) who provided a complete structural model. Previously, Takeuchi (1950) had refined an OH-dominant fluoborite (OH ~70%), but the limited quantity of data (extracted from two Weissenberg-Buerger photographs) did not permit the location of H atoms. Dal Negro and Tadini (1974) also could not locate H atoms because they used a crystal with near end-member composition. We have located the H bond in an OH-dominant fluoborite from the Betic Cordilleras (SE Spain). Excellent quality X-ray data on two crystals of fluoborite allowed discovery and refinement of the H position in this mineral. Electron microprobe (EMP) and secondary-ion mass spectrometry (SIMS) analyses of the light elements H, B, and F have resulted in the formulation of special procedures to obtain accurate, highquality quantitative data, which are presented in this paper. EMP, SIMS, and crystal structure refinement (SREF) data are in a good agreement. Linear equations are also presented to calculate the F content directly from cell parameters.

New data on the crystal-chemistry of fluoborite by means of SREF, SIMS, and EMP analysis / F. Camara, L. Ottolini. - In: AMERICAN MINERALOGIST. - ISSN 0003-004X. - 85:1(2000), pp. 103-107. [10.2138/am-2000-0111]

New data on the crystal-chemistry of fluoborite by means of SREF, SIMS, and EMP analysis

F. Camara
;
2000

Abstract

The crystal structure of fluoborite [Mg3F3(BO3)] was refined by Dal Negro and Tadini (1974) who provided a complete structural model. Previously, Takeuchi (1950) had refined an OH-dominant fluoborite (OH ~70%), but the limited quantity of data (extracted from two Weissenberg-Buerger photographs) did not permit the location of H atoms. Dal Negro and Tadini (1974) also could not locate H atoms because they used a crystal with near end-member composition. We have located the H bond in an OH-dominant fluoborite from the Betic Cordilleras (SE Spain). Excellent quality X-ray data on two crystals of fluoborite allowed discovery and refinement of the H position in this mineral. Electron microprobe (EMP) and secondary-ion mass spectrometry (SIMS) analyses of the light elements H, B, and F have resulted in the formulation of special procedures to obtain accurate, highquality quantitative data, which are presented in this paper. EMP, SIMS, and crystal structure refinement (SREF) data are in a good agreement. Linear equations are also presented to calculate the F content directly from cell parameters.
ion mass-spectrometry; boron; silicates; hydrogen
Settore GEO/06 - Mineralogia
2000
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/443596
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