In this work, we present and discuss the use of cavity-microelectrodes (C-MEs) used as tip for the scanning electrochemical microscopy (SECM). Cavity-microelectrodes can be filled with a desired finely dispersed material thus compensating for the limited commercial availability of microwires. After discussing the possibility of filling and emptying a cavity-microelectrode with a desired tip shape, the consistency of negative and positive feedback approach curves obtained after filling a Au C-ME was verified. In addition, the tip/C-ME was tested under gas (oxygen) evolution condition, in order to demonstrate that the filling is stable in a wide range of gas fluxes thus extending the possible applications to tip generation/substrate collection mode. Finally, we introduce the use of the proposed system to quantify the rates of parallel reactions occurring at the material inserted in the tip under the tip generation/substrate collection mode.
The cavity-microelectrode as a tip for scanning electrochemical microscopy / S. Morandi, A. Minguzzi. - In: ELECTROCHEMISTRY COMMUNICATIONS. - ISSN 1388-2481. - 59(2015), pp. 100-103. [10.1016/j.elecom.2015.07.010]
The cavity-microelectrode as a tip for scanning electrochemical microscopy
S. MorandiPrimo
;A. Minguzzi
2015
Abstract
In this work, we present and discuss the use of cavity-microelectrodes (C-MEs) used as tip for the scanning electrochemical microscopy (SECM). Cavity-microelectrodes can be filled with a desired finely dispersed material thus compensating for the limited commercial availability of microwires. After discussing the possibility of filling and emptying a cavity-microelectrode with a desired tip shape, the consistency of negative and positive feedback approach curves obtained after filling a Au C-ME was verified. In addition, the tip/C-ME was tested under gas (oxygen) evolution condition, in order to demonstrate that the filling is stable in a wide range of gas fluxes thus extending the possible applications to tip generation/substrate collection mode. Finally, we introduce the use of the proposed system to quantify the rates of parallel reactions occurring at the material inserted in the tip under the tip generation/substrate collection mode.File | Dimensione | Formato | |
---|---|---|---|
35_EC_2015_C-ME_SECM.pdf
accesso riservato
Tipologia:
Publisher's version/PDF
Dimensione
668.18 kB
Formato
Adobe PDF
|
668.18 kB | Adobe PDF | Visualizza/Apri Richiedi una copia |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.