IR camera systems can be used for reflectographic analyses to detect and visualize underdrawings in paintings. Five technologies have been compared: CCD Si, FPA InGaAs, FPA HgCdTe and InSb detectors, and a vidicon tube. The comparison has been performed studying the relative contrast measured on homogeneous pictorial layers in infrared regions between 800 and 5000nm. This comparison was completed through measurements of spectral transmittance (400-2500nm) made with a spectrometer. The results have been related to the kind of pigment and of medium and to the thickness of the layer. All the systems have been tested also on the field, on paintings belonging to different museums. Some results are discussed.
A new methodology for comparing IR reflectographic systems / G. Poldi, M. Gargano, N. Ludwig. - In: INFRARED PHYSICS & TECHNOLOGY. - ISSN 1350-4495. - 49:3(2007 Jan), pp. 249-253.
|Titolo:||A new methodology for comparing IR reflectographic systems|
GARGANO, MARCO (Secondo)
LUDWIG, NICOLA GHERARDO (Ultimo)
|Parole Chiave:||CCD image sensors ; exhibitions ; focal planes ; infrared spectra ; infrared spectrometers ; nondestructive testing ; painting ; photodetectors ; pigments ; television camera tubes|
|Settore Scientifico Disciplinare:||Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)|
|Data di pubblicazione:||gen-2007|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/j.infrared.2006.06.013|
|Appare nelle tipologie:||01 - Articolo su periodico|