We present a combined experimental and theoretical investigation of the magnetic behavior of ultra-thin Cr films grown on oxygen-passivated Fe(001)-p(1×1)O substrates. In all cases, oxygen floats on the metal/vacuum interface, where a monolayer-range oxide with peculiar electronic and structural characteristics is formed. Significant differences with previous experimental realizations of the Cr/Fe(001) heterostructure are thus introduced by the presence of oxygen. However, we show here that the magnetic behavior of our system is characterized by the same AF stacking at the Cr-Fe interface and by a layer-wise AF order in the Cr layer. In addition, we are able to circumvent the issue of chemical mixing at the Cr-Fe interface, characteristic of standard preparations.
Magnetism in thin Cr films grown on Fe(001)-p(1×1)O: a spin-resolved investigation of single and multi-layers / A. Calloni, G. Berti, A. Brambilla, G. Bussetti, M. Finazzi, L. Duò, F. Ciccacci, G. Fratesi (PROCEEDINGS OF SPIE, THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING). - In: Spintronics VIII / [a cura di] H.-J. Drouhin, J.-E. Wegrowe, M. Razeghi. - Bellingham : SPIE, 2015 Sep 08. - ISBN 9781628417173. (( Intervento presentato al 8. convegno Spintronics symposium tenutosi a San Diego nel 2015 [10.1117/12.2188435].
Magnetism in thin Cr films grown on Fe(001)-p(1×1)O: a spin-resolved investigation of single and multi-layers
G. FratesiUltimo
2015
Abstract
We present a combined experimental and theoretical investigation of the magnetic behavior of ultra-thin Cr films grown on oxygen-passivated Fe(001)-p(1×1)O substrates. In all cases, oxygen floats on the metal/vacuum interface, where a monolayer-range oxide with peculiar electronic and structural characteristics is formed. Significant differences with previous experimental realizations of the Cr/Fe(001) heterostructure are thus introduced by the presence of oxygen. However, we show here that the magnetic behavior of our system is characterized by the same AF stacking at the Cr-Fe interface and by a layer-wise AF order in the Cr layer. In addition, we are able to circumvent the issue of chemical mixing at the Cr-Fe interface, characteristic of standard preparations.File | Dimensione | Formato | |
---|---|---|---|
95511K.pdf
accesso aperto
Tipologia:
Post-print, accepted manuscript ecc. (versione accettata dall'editore)
Dimensione
1.82 MB
Formato
Adobe PDF
|
1.82 MB | Adobe PDF | Visualizza/Apri |
Pubblicazioni consigliate
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.