We present in this paper a novel methodology that combines scanning x‐ray fluorescencee microscopy and atomic force microscopy. The combination of these two techniques allows the determination of a concentration map of Mg in whole (not sectioned) cells.
Combined X-ray microfluorescence and atomic force microscopy studies of Mg distribution in whole cells / S. Lagomarsino, S. Iotti, G. Farruggia, V. Trapani, A. Cedola, M. Fratini, I. Bukreeva, L. Mastrototaro, A. Notargiacomo, I. Mcnulty, V.S. K. S, D. Legnini, J. Maier, W. Fi - In: The International Conference on X-Ray Microscopy / [a cura di] I. McNulty, C. Eyberger, B. Lai. - Prima edizione. - Mellville (N.Y.) : American Institute of Physics, 2011. - ISBN 9780735409255. - pp. 395-398 (( Intervento presentato al 10. convegno International Conference on X‐Ray Microscopy tenutosi a Chicago, Illinois, (USA) nel 2011.
Combined X-ray microfluorescence and atomic force microscopy studies of Mg distribution in whole cells
J. Maier;
2011
Abstract
We present in this paper a novel methodology that combines scanning x‐ray fluorescencee microscopy and atomic force microscopy. The combination of these two techniques allows the determination of a concentration map of Mg in whole (not sectioned) cells.
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