In this work we present the first results of a detector characterization technique named Pulse Shape Comparison Scan (PSCS), applied to a large volume segmented HPGe detector of the AGATA array. The experimental data were collected with the Liverpool University scanning system. Processing two sets of singles scan data acquired with a 137Cs (662 keV) gamma collimated source (with the collimation lines perpendicular one in respect to the other), it has been possible to extract the position response of 4 detector segments. © 2010 IEEE.

Characterization of segmented HPGe detectors using Pulse Shape Comparison methods / F.C.L. Crespi, V. Vandone, F. Camera, S. Brambilla, B. Million, S. Riboldi, O. Wieland, A.J. Boston, C. Unsworth, H.C. Boston, S.J. Colosimo, S. Moon, P.J. Nolan - In: IEEE Nuclear Science Symposium Conference Record[s.l] : IEEE, 2010. - ISBN 9781424491063. - pp. 825-827 (( convegno 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 tenutosi a Knoxville, TN, usa nel 2010.

Characterization of segmented HPGe detectors using Pulse Shape Comparison methods

F.C.L. Crespi
;
V. Vandone
;
F. Camera
;
S. Riboldi
;
2010

Abstract

In this work we present the first results of a detector characterization technique named Pulse Shape Comparison Scan (PSCS), applied to a large volume segmented HPGe detector of the AGATA array. The experimental data were collected with the Liverpool University scanning system. Processing two sets of singles scan data acquired with a 137Cs (662 keV) gamma collimated source (with the collimation lines perpendicular one in respect to the other), it has been possible to extract the position response of 4 detector segments. © 2010 IEEE.
English
Radiation; Nuclear and High Energy Physics; Radiology, Nuclear Medicine and Imaging
Settore FIS/04 - Fisica Nucleare e Subnucleare
Intervento a convegno
Pubblicazione scientifica
IEEE Nuclear Science Symposium Conference Record
IEEE
2010
825
827
3
9781424491063
Volume a diffusione internazionale
2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010
Knoxville, TN, usa
2010
Nucl. Plasma Sci. Soc. Inst. Electr. Electron. Eng. (NPSS)
Convegno internazionale
Intervento inviato
scopus
crossref
Aderisco
F.C.L. Crespi, V. Vandone, F. Camera, S. Brambilla, B. Million, S. Riboldi, O. Wieland, A.J. Boston, C. Unsworth, H.C. Boston, S.J. Colosimo, S. Moon,...espandi
Book Part (author)
open
273
Characterization of segmented HPGe detectors using Pulse Shape Comparison methods / F.C.L. Crespi, V. Vandone, F. Camera, S. Brambilla, B. Million, S. Riboldi, O. Wieland, A.J. Boston, C. Unsworth, H.C. Boston, S.J. Colosimo, S. Moon, P.J. Nolan - In: IEEE Nuclear Science Symposium Conference Record[s.l] : IEEE, 2010. - ISBN 9781424491063. - pp. 825-827 (( convegno 2010 IEEE Nuclear Science Symposium, Medical Imaging Conference, NSS/MIC 2010 and 17th International Workshop on Room-Temperature Semiconductor X-ray and Gamma-ray Detectors, RTSD 2010 tenutosi a Knoxville, TN, usa nel 2010.
info:eu-repo/semantics/bookPart
13
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/248367
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