In this paper, the fixed energy X-ray absorption voltammetry (FEXRAV) is introduced. FEXRAV represents a novel in situ X-ray absorption technique for fast and easy preliminary characterization of electrode materials and consists of recording the absorption coefficient at a fixed energy while varying at will the electrode potential. The energy is chosen close to an X-ray absorption edge, in order to give the maximum contrast between different oxidation states of an element. It follows that any shift from the original oxidation state determines a variation of the absorption coefficient. Although the information given by FEXRAV obviously does not supply the detailed information of X-ray absorption near edge structure (XANES) or extended X-ray absorption fine structure (EXAFS), it allows to quickly map the oxidation states of the element under consideration within the selected potential windows. This leads to the rapid screening of several systems under different experimental conditions (e.g., nature of the electrolyte, potential window) and is preliminary to more deep X-ray absorption spectroscopy (XAS) characterizations, like XANES or EXAFS. In addition, the time-length of the experiment is much shorter than a series of XAS spectra and opens the door to kinetic analysis.
|Titolo:||Fixed Energy X‑ray Absorption Voltammetry|
|Settore Scientifico Disciplinare:||Settore CHIM/02 - Chimica Fisica|
|Data di pubblicazione:||16-lug-2013|
|Digital Object Identifier (DOI):||10.1021/ac401414v|
|Appare nelle tipologie:||01 - Articolo su periodico|