The thermally agglomerated Au/Si(111) interface has been studied by means of laterally resolved photoemission by exploiting the ultra-high brightness of the ELETTRA synchrotron radiation source. The interface has been evaluated in terms of chemical maps and core level spectra acquired from selected points of the specimen surface. The variety of distinct chemical environments local to element-specific sites has thereby been clarified with an unprecedented level of resolution at both the islands and the two-dimensional superstructure terminating the Si crystal.
|Titolo:||Spectromicroscopy of the metastable interface studied by means of synchrotron radiation|
|Parole Chiave:||Gold; Low index single crystal surfaces; Metal-semiconductor interfaces; Silicon; Synchrotron radiation photoelectron spectroscopy|
|Settore Scientifico Disciplinare:||Settore FIS/01 - Fisica Sperimentale|
|Data di pubblicazione:||1997|
|Digital Object Identifier (DOI):||10.1016/S0039-6028(96)01380-5|
|Appare nelle tipologie:||01 - Articolo su periodico|