The composition of γ-FeOOH layers deposited by anodic oxidation of Fe2+ from NaCI solutions has been investigated by Auger electron spectroscopy depth profiling. In different samples the O/Fe ratio varied in a continuous and reproducible way along the layer thickness. The observed features and the detection of Cl- suggest that all of the layer is involved in a hydration process. The results are used to discuss the growth mechanism of the oxide. © 1988.
AES depth profiling of electrochemically grown γ-FeOOH / S. Ardizzone, L. Formaro. - In: JOURNAL OF ELECTROANALYTICAL CHEMISTRY AND INTERFACIAL ELECTROCHEMISTRY. - ISSN 0022-0728. - 246:1(1988), pp. 53-61.
Titolo: | AES depth profiling of electrochemically grown γ-FeOOH | |
Autori: | ARDIZZONE, SILVIA (Primo) FORMARO, LEONARDO GIANMARIA (Ultimo) | |
Settore Scientifico Disciplinare: | Settore CHIM/02 - Chimica Fisica | |
Data di pubblicazione: | 1988 | |
Rivista: | ||
Tipologia: | Article (author) | |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1016/0022-0728(88)85050-2 | |
Appare nelle tipologie: | 01 - Articolo su periodico |