We present a new method to analyze quantitatively the wave front of a partially coherent x-ray beam. The technique is based on the use of two-dimensional speckle patterns combined with digital image correlation algorithms and offers a pixel size resolution, a high accuracy, and a reduced sensitivity to mechanical vibrations thanks to a very simple setup. The requirements on transverse and longitudinal coherence are also low. Finally, we show how the method can be used for phase contrast imaging applications by a single sample exposure process.

Two-dimensional x-ray beam phase sensing / S. Bérujon, E. Ziegler, R. Cerbino, L. Peverini. - In: PHYSICAL REVIEW LETTERS. - ISSN 0031-9007. - 108:15(2012 Apr 11), pp. 158102.1-158102.5.

Two-dimensional x-ray beam phase sensing

R. Cerbino
Penultimo
;
2012

Abstract

We present a new method to analyze quantitatively the wave front of a partially coherent x-ray beam. The technique is based on the use of two-dimensional speckle patterns combined with digital image correlation algorithms and offers a pixel size resolution, a high accuracy, and a reduced sensitivity to mechanical vibrations thanks to a very simple setup. The requirements on transverse and longitudinal coherence are also low. Finally, we show how the method can be used for phase contrast imaging applications by a single sample exposure process.
synchrotron-radiation; interferometer; tomography; scattering; contrast; sensor
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
Settore FIS/03 - Fisica della Materia
11-apr-2012
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/173499
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