This paper presents methodological innovations introduced in the characterisation of urban aerosol collected in Italy in a recent campaign. Two complementary ion beam analysis (IBA) techniques were used to analyse Nuclepore filters used in continuous streaker samplers to collect airborne particles in four Italian towns. Na to Pb elemental concentrations were obtained by particle induced X-ray emission (PIXE), while time of flight secondary ion mass spectrometry (ToF-SIMS) produced, on the same samples, time trends for several elements and molecular fragments. In addition, light attenuation measurements were used as a tracer for black carbon. The data produced by these three techniques was merged into a unique data set to address the characterisation of particulate matter sources. Correlations between elemental concentration trends (PIXE) and relative trends for molecular fragments (ToF-SIMS) and black carbon (light attenuation) have been studied by cluster and principal component analysis.
PIXE and ToF-SIMS analysis of streaker samplers filters / A. D'ALESSANDRO, S. NAVA, R. VAN HAM, A. ADRIAENS, F. LUCARELLI, G. MARCAZZAN, P. PRATI, G. VALLI, R. VECCHI, A. ZUCCHIATTI. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS. - ISSN 0168-583X. - 222:1-2(2004), pp. 261-269.
|Titolo:||PIXE and ToF-SIMS analysis of streaker samplers filters|
VECCHI, ROBERTA (Penultimo)
|Parole Chiave:||Particulate matter; PIXE; Streaker sampler; ToF-SIMS; Urban pollution|
|Settore Scientifico Disciplinare:||Settore FIS/06 - Fisica per il Sistema Terra e Il Mezzo Circumterrestre|
Settore FIS/07 - Fisica Applicata(Beni Culturali, Ambientali, Biol.e Medicin)
|Data di pubblicazione:||2004|
|Digital Object Identifier (DOI):||http://dx.doi.org/10.1016/j.nimb.2004.02.014|
|Appare nelle tipologie:||01 - Articolo su periodico|