Testability analysis of neural architectures can be performed at a very high abstraction level on the computational paradigm. In this paper, we consider the case of feed-forward multi-layered neural networks. We introduce a behavioral error model which allows good mapping of the physical faults in widely different implementations. Conditions for error controllability, observability and global testability are analytically derived; their purpose is that of verifying whether it is possible to excite all modeled errors and to propagate the error''s effects to the primary outputs (actual test vectors being then technological-dependent). Mapping of physical faults onto behavioral errors is performed for some representative, architectures.

Testability of artificial neural networks : a behavioral approach / V. Piuri, M. Sami, D. Sciuto. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 6:2(1995), pp. 179-190.

Testability of artificial neural networks : a behavioral approach

V. Piuri
Primo
;
1995

Abstract

Testability analysis of neural architectures can be performed at a very high abstraction level on the computational paradigm. In this paper, we consider the case of feed-forward multi-layered neural networks. We introduce a behavioral error model which allows good mapping of the physical faults in widely different implementations. Conditions for error controllability, observability and global testability are analytically derived; their purpose is that of verifying whether it is possible to excite all modeled errors and to propagate the error''s effects to the primary outputs (actual test vectors being then technological-dependent). Mapping of physical faults onto behavioral errors is performed for some representative, architectures.
English
behavioral testing; controllability; feed-forward neural networks; neural error models; observability
Settore ING-INF/05 - Sistemi di Elaborazione delle Informazioni
Articolo
Esperti anonimi
1995
Springer
6
2
179
190
Pubblicato
Periodico con rilevanza internazionale
info:eu-repo/semantics/article
Testability of artificial neural networks : a behavioral approach / V. Piuri, M. Sami, D. Sciuto. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 6:2(1995), pp. 179-190.
none
Prodotti della ricerca::01 - Articolo su periodico
3
262
Article (author)
no
V. Piuri, M. Sami, D. Sciuto
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/160560
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