This paper estimates the international diffusion of technical knowledge using patent citations. We control for self-citations and for procedural differences between patent offices using equivalent patents. We find that (1) there are clear biases in patent examination processes that generate citations in the two offices; (2) at the EPO there is a strong localization effect at the country level, and the size is comparable to that found at the USPTO; (3) technological fields have different properties of diffusion in the two patent offices that do not depend on a patent office bias; (4) using EPO data, the US is not the leading country in terms of citations made and received, as occurs at the USPTO.

International knowledge diffusion and home-bias effect : do USPTO & EPO patent citations tell the same story? / E. Bacchiocchi, F. Montobbio. - In: SCANDINAVIAN JOURNAL OF ECONOMICS. - ISSN 0347-0520. - 112:3(2010 Sep), pp. 441-470. [10.1111/j.1467-9442.2010.01614.x]

International knowledge diffusion and home-bias effect : do USPTO & EPO patent citations tell the same story?

E. Bacchiocchi
Primo
;
2010

Abstract

This paper estimates the international diffusion of technical knowledge using patent citations. We control for self-citations and for procedural differences between patent offices using equivalent patents. We find that (1) there are clear biases in patent examination processes that generate citations in the two offices; (2) at the EPO there is a strong localization effect at the country level, and the size is comparable to that found at the USPTO; (3) technological fields have different properties of diffusion in the two patent offices that do not depend on a patent office bias; (4) using EPO data, the US is not the leading country in terms of citations made and received, as occurs at the USPTO.
Diffusion; Knowledge flows; O31; O33; O34; Patent citations; Patents; Spillovers
Settore SECS-P/05 - Econometria
Settore SECS-P/06 - Economia Applicata
set-2010
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/151711
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