In this work, the effect of triple-well shielding in mixed-signal integrated circuits is studied. A test chip is presented that contains structures intended for investigation on substrate noise coupling. This paper shows a subset of the measurements that we carried out and attempts to give a rationale for them.
Model and verification of triple-well shielding on substrate noise in mixed-signal CMOS ICs / R. Rossi, G. Torelli, V. Liberali - In: ESSCIRC 2003 : proceedings of the 29. European solid-state circuits conference, Estoril, Portugal, 16-18 September 2003 / [a cura di] J. Franca, R. Koch. - [Piscataway, N.Y.] : IEEE, 2003 Sep. - ISBN 0-7803-7995-0. - pp. 643-646 (( Intervento presentato al 29. convegno ESSCIRC : European solid-state circuits conference tenutosi a Estoril, Portugal nel 2003.
Model and verification of triple-well shielding on substrate noise in mixed-signal CMOS ICs
V. Liberali
2003
Abstract
In this work, the effect of triple-well shielding in mixed-signal integrated circuits is studied. A test chip is presented that contains structures intended for investigation on substrate noise coupling. This paper shows a subset of the measurements that we carried out and attempts to give a rationale for them.
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