A novel focused ion beam-based technique is presented for the read-out of microradiographs of Caenorhabditis elegans nematodes generated by soft x-ray contact microscopy (SXCM). In previous studies, the read-out was performed by atomic force microscopy (AFM), but in our work SXCM microradiographs were imaged by scanning ion microscopy (SIM) in a focused ion beam/scanning electron microscope (FIB/SEM). It allows an ad libitum selection of a sample region for gross morphologic to nanometric investigations, with a sequence of imaging and cutting. The FIB/SEM is less sensitive to height variation of the relief, and sectioning makes it possible to analyse the sample further. The SXCM can be coupled to SIM in a more efficient and faster way than to AFM. Scanning ion microscopy is the method of choice for the read-out of microradiographs of small multicellular organisms.
Read-out of soft X-ray contact microscopy microradiographs by focused ion beam/scanning electron microscope / M. Milani, D. Drobne, F. Tatti, D. Batani, G. Poletti, F. Orsini, A. Zullini, A. Zrimec. - In: SCANNING. - ISSN 0161-0457. - 27:5(2005), pp. 249-253.
|Titolo:||Read-out of soft X-ray contact microscopy microradiographs by focused ion beam/scanning electron microscope|
|Parole Chiave:||Atomic force microscopy; Caenorhabditis elegans; Focused ion beam; Soft x-ray microscopy; Ultramicroscopy|
|Settore Scientifico Disciplinare:||Settore FIS/01 - Fisica Sperimentale|
|Data di pubblicazione:||2005|
|Appare nelle tipologie:||01 - Articolo su periodico|