We report on a setup for photoluminescence (PL) spectroscopy, allowing to perform time resolved, steady-state, and spatially resolved PL and PL imaging. Time domain information (with ≈50 ps resolution) is achieved via time-correlated single photon counting (TCSPC), while the spectral information (in the ≈1–4 eV NIR-UV energy range) is accessed through a common-path interferometer based on birefringence, with the PL spectrum being retrieved via a Fourier transform approach. The micro-PL approach allows us to measure the PL signal of micron-sized samples, such as exfoliated 2D semiconductors. Moreover, the high efficiency of signal collection and analysis allows us to resolve weak PL signals from indirect-bandgap semiconductors. We measure the time-, frequency-, and spatially resolved PL on exfoliated flakes of WSe2, MoS2, and WS2 as examples to display the potential of our new apparatus.

Integrated setup for time and spatially resolved micro-photoluminescence / M. Perlangeli, G. Pierantozzi, A. Fondacaro, P. Sander, E. Dobovicnik, F. Parmigiani, G. Rossi, G. Panaccione, F. Cilento, R. Cucini. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 97:2(2026 Feb 20), pp. 023004.1-023004.9. [10.1063/5.0284800]

Integrated setup for time and spatially resolved micro-photoluminescence

G. Rossi;
2026

Abstract

We report on a setup for photoluminescence (PL) spectroscopy, allowing to perform time resolved, steady-state, and spatially resolved PL and PL imaging. Time domain information (with ≈50 ps resolution) is achieved via time-correlated single photon counting (TCSPC), while the spectral information (in the ≈1–4 eV NIR-UV energy range) is accessed through a common-path interferometer based on birefringence, with the PL spectrum being retrieved via a Fourier transform approach. The micro-PL approach allows us to measure the PL signal of micron-sized samples, such as exfoliated 2D semiconductors. Moreover, the high efficiency of signal collection and analysis allows us to resolve weak PL signals from indirect-bandgap semiconductors. We measure the time-, frequency-, and spatially resolved PL on exfoliated flakes of WSe2, MoS2, and WS2 as examples to display the potential of our new apparatus.
Settore PHYS-03/A - Fisica sperimentale della materia e applicazioni
20-feb-2026
2025
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/1240698
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