We discuss how the range of information available from microparticle analysis can be extended in a number of applications by measuring a specific set of optical properties of individual particles using light scattering. Central to these measurements are the real and imaginary components of the forward scattered field, the former being equal to the extinction cross-section except for a few particle-independent constants. Although still a niche technique, it has some inherent advantages and great potential for particle characterization, especially in the challenging near-wavelength size range. A selection of cases is covered from an experimental point of view, while some essential models are introduced to illustrate the underlying physical phenomena. We present a benchmark of experimental results from the literature and other examples that support optical diagnostics applied in science and industrial processes. As a key point of this work, we show that by accessing the fundamental properties of scatterers the inversion of light scattering data can be avoided. This provides model-independent results closer to application requirements without the drawbacks of case-specific assumptions.
An overview of the optical characterization of free microparticles and their radiative properties / M.A.C. Potenza, L. Cremonesi. - In: JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER. - ISSN 0022-4073. - 311:(2023 Dec), pp. 108773.1-108773.20. [10.1016/j.jqsrt.2023.108773]
An overview of the optical characterization of free microparticles and their radiative properties
M.A.C. Potenza
Primo
;
2023
Abstract
We discuss how the range of information available from microparticle analysis can be extended in a number of applications by measuring a specific set of optical properties of individual particles using light scattering. Central to these measurements are the real and imaginary components of the forward scattered field, the former being equal to the extinction cross-section except for a few particle-independent constants. Although still a niche technique, it has some inherent advantages and great potential for particle characterization, especially in the challenging near-wavelength size range. A selection of cases is covered from an experimental point of view, while some essential models are introduced to illustrate the underlying physical phenomena. We present a benchmark of experimental results from the literature and other examples that support optical diagnostics applied in science and industrial processes. As a key point of this work, we show that by accessing the fundamental properties of scatterers the inversion of light scattering data can be avoided. This provides model-independent results closer to application requirements without the drawbacks of case-specific assumptions.File | Dimensione | Formato | |
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