This paper reports the first ATLAS measurement of the B-s(0) -> mu mu effective lifetime. The measurement is based on the data collected in 2015-2016, amounting to 26.3 fb(-1) of 13TeV LHC proton-proton collisions. The proper decay-time distribution of 58 +/- 13 background-subtracted signal candidates is fit with simulated signal templates parameterised as a function of the B-s(0) effective lifetime, with statistical uncertainties extracted through a Neyman construction. The resulting effective measurement of the B-s(0) -> mu mu lifetime is 0.99(-0.07)(+0.42) (stat.) +/- 0.17 (syst.) ps and it is found to be consistent with the Standard Model.

Measurement of the $$ {B}_s^0 $$ → μμ effective lifetime with the ATLAS detector [Measurement of the Bºₛ º⁰→ μμ effective lifetime with the ATLAS detector] / G. Aad, B.A.. - In: JOURNAL OF HIGH ENERGY PHYSICS. - ISSN 1029-8479. - 2023:9(2023 Sep 28), pp. 199.1-199.32. [10.1007/jhep09(2023)199]

Measurement of the $$ {B}_s^0 $$ → μμ effective lifetime with the ATLAS detector [Measurement of the Bºₛ º⁰→ μμ effective lifetime with the ATLAS detector]

A. Andreazza;A. Carbone;L. Carminati;S. D'Auria;L. Dell'Asta;M. Fanti;M. Lazzaroni;E. Mazzeo;C. Meroni;D.P. Mungo;A. Murrone;L. Perini;F. Ragusa;A. Stabile;
2023

Abstract

This paper reports the first ATLAS measurement of the B-s(0) -> mu mu effective lifetime. The measurement is based on the data collected in 2015-2016, amounting to 26.3 fb(-1) of 13TeV LHC proton-proton collisions. The proper decay-time distribution of 58 +/- 13 background-subtracted signal candidates is fit with simulated signal templates parameterised as a function of the B-s(0) effective lifetime, with statistical uncertainties extracted through a Neyman construction. The resulting effective measurement of the B-s(0) -> mu mu lifetime is 0.99(-0.07)(+0.42) (stat.) +/- 0.17 (syst.) ps and it is found to be consistent with the Standard Model.
B Physics; Hadron-Hadron Scattering
Settore FIS/01 - Fisica Sperimentale
Settore ING-INF/07 - Misure Elettriche e Elettroniche
28-set-2023
https://link.springer.com/article/10.1007/JHEP09(2023)199
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2434/1052777
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