PEREGO, MICHELE
PEREGO, MICHELE
Universita' degli Studi di MILANO
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Risultati 1 - 4 di 4 (tempo di esecuzione: 0.0 secondi).
Modeling of phosphorus diffusion in silicon oxide and incorporation in silicon nanocrystals
2016 M. Mastromatteo, D. De Salvador, E. Napolitani, E. Arduca, G. Seguini, J. Frascaroli, M. Perego, G. Nicotra, C. Spinella, C. Lenardi, A. Carnera
Synthesis and characterization of P delta-layer in SiO2 by monolayer doping
2016 E. Arduca, M. Mastromatteo, D. De Salvador, G. Seguini, C. Lenardi, E. Napolitani, M. Perego
Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO2 matrix studied by atom probe tomography
2016 B. Han, Y. Shimizu, G. Seguini, E. Arduca, C. Castro, G. Ben Assayag, K. Inoue, Y. Nagai, S. Schamm-Chardon, M. Perego
Surface passivation for ultrathin Al2O3 layers grown at low temperature by thermal atomic layer deposition
2013 J. Frascaroli, G. Seguini, E. Cianci, D. Saynova, J. Van Roosmalen, M. Perego
| Titolo | Data di pubblicazione | Autori | Tipo | File | Abstract |
|---|---|---|---|---|---|
| Modeling of phosphorus diffusion in silicon oxide and incorporation in silicon nanocrystals | 2016 | ARDUCA, ELISAJ. FrascaroliM. PeregoG. NicotraC. Lenardi + | Article (author) | - | |
| Synthesis and characterization of P delta-layer in SiO2 by monolayer doping | 2016 | E. ArducaC. LenardiM. Perego + | Article (author) | - | |
| Evolution of shape, size, and areal density of a single plane of Si nanocrystals embedded in SiO2 matrix studied by atom probe tomography | 2016 | E. ArducaM. Perego + | Article (author) | - | |
| Surface passivation for ultrathin Al2O3 layers grown at low temperature by thermal atomic layer deposition | 2013 | J. FrascaroliM. Perego + | Article (author) | - |